AlGe wafer bonding in ultra-high vacuum environment

نویسندگان

چکیده

Despite it being known that native oxides impair diffusion processes during eutectic wafer bonding, the possibility of oxide removal combined with avoidance regrowth on surfaces is not usually employed in AlGe bonding. In present work, focus impact different process parameters like temperature, concentration, and bonding layer, while processing inside ultra-high vacuum. Based results, could be shown situ enables acceptable results already below temperature Te = 423 °C, which would required to liquefy layer at concentration ce 28.4 at. % Ge. Even if system was entering liquid state, solid-state sufficient achieve a high quality. The applied force corresponds pressure ∼0.16 MPa, much lower compared typical (ex situ) process. addition, clarified extreme variations concentrations above were as critical expected. A good phase mixture well low number voids has been observed even resulting did fit ce. main feature system, suppressing re-growth, enhanced quality result regular ex approach.

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ژورنال

عنوان ژورنال: Journal of vacuum science and technology

سال: 2023

ISSN: ['2166-2746', '2166-2754']

DOI: https://doi.org/10.1116/6.0002539